Tiny spaces have formed inside titanium dioxide nanocrystals, as shown in this SEM image. The square structure of these inside spaces, which measure between 20 nm and 40 nm, is due to the crystalline structure of the material. (Image: L. Nasi, IMEM (CNR), Parma. Artwork: Lucia Covi)
SEM image of a work sample on a magnesium oxide surface using FIB. The diameter of the hole measures approximate. 4 µm. (Image: G.C. Gazzadi, A. Spessot, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
SEM image of a micron sized trench (10 x 20 x14 µm
3) in a Cu/SiO
2/Si multilayer, obtained through FIB milling. The precision of this technique allows the visualization of ultrathin (tens of nanometers) layers. (Image: G.C.Gazzadi, S.Frabboni, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
Scanning electron microscope (SEM) image of quantum dots fabricated through electron beam lithography and subsequent dry-chemical etching on a quasi bidimensional layer (GaAl heterostructure). These structures are used to study the behavior of electrons, which are confined into tiny spaces – approximate. 10 electrons per dot. The diameter of each quantum dot is 200 nm (which means that a billion of these structure easily fit on the tip of your finger). (Image: C.P. Garcia, V. Pellegrini , NEST (INFM), Pisa. Artwork: Lucia Covi)
Top view of a hole carved in a polyethylene surface. During a series of experiments the use of a FIB has proven to be very versatile and capable of carving various materials, including plastic. (Image: G.C. Gazzadi, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
Developing new instruments to be able to "see" at the nanoscale is a research field in itself. Shown here is the tip of an atomic force microscope (AFM), one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. Here, a platinum electrode measuring one hundredth of a nanometer has been deposited on the tip of this pyramid shaped AFM tip via focused ion beam (FIB) deposition. (Image: C. Menozzi, G.C. Gazzadi, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
Tiny spaces have formed inside titanium dioxide nanocrystals, as shown in this SEM image. The square structure of these inside spaces, which measure between 20 nm and 40 nm, is due to the crystalline structure of the material. (Image: L. Nasi, IMEM (CNR), Parma. Artwork: Lucia Covi) 
SEM image of a work sample on a magnesium oxide surface using FIB. The diameter of the hole measures approximate. 4 µm. (Image: G.C. Gazzadi, A. Spessot, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
SEM image of a micron sized trench (10 x 20 x14 µm3) in a Cu/SiO2/Si multilayer, obtained through FIB milling. The precision of this technique allows the visualization of ultrathin (tens of nanometers) layers. (Image: G.C.Gazzadi, S.Frabboni, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
Scanning electron microscope (SEM) image of quantum dots fabricated through electron beam lithography and subsequent dry-chemical etching on a quasi bidimensional layer (GaAl heterostructure). These structures are used to study the behavior of electrons, which are confined into tiny spaces – approximate. 10 electrons per dot. The diameter of each quantum dot is 200 nm (which means that a billion of these structure easily fit on the tip of your finger). (Image: C.P. Garcia, V. Pellegrini , NEST (INFM), Pisa. Artwork: Lucia Covi)
Top view of a hole carved in a polyethylene surface. During a series of experiments the use of a FIB has proven to be very versatile and capable of carving various materials, including plastic. (Image: G.C. Gazzadi, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
Developing new instruments to be able to "see" at the nanoscale is a research field in itself. Shown here is the tip of an atomic force microscope (AFM), one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. Here, a platinum electrode measuring one hundredth of a nanometer has been deposited on the tip of this pyramid shaped AFM tip via focused ion beam (FIB) deposition. (Image: C. Menozzi, G.C. Gazzadi, S3 (INFM-CNR), Modena. Artwork: Lucia Covi)
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